X-ray source characterization and sample heating on x-ray diffraction experiments at the National Ignition Facility

A. Krygier, C. E. Wehrenberg, J. V. Bernier, S. Clarke, A. L. Coleman, F. Coppari, T. S. Duffy, M. G. Gorman, M. Hohenberger, D. Kalantar, G. E. Kemp, S. F. Khan, C. Krauland, R. G. Kraus, A. Lazicki, M. J. Macdonald, A. G. Macphee, E. Marley, M. C. Marshall, M. MayJ. M. McNaney, M. Millot, Y. Ping, P. L. Poole, J. R. Rygg, M. Schneider, H. Sio, S. Stoupin, D. Swift, C. Yeamans, T. Zobrist, R. F. Smith, J. H. Eggert

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

X-ray diffraction is a powerful measurement technique for determining material properties, and it is now possible to perform these experiments at pressures exceeding 1 TPa [Rygg et al., Rev. Sci. Instrum. 91, 043902 (2020)] at the National Ignition Facility (NIF). The x-ray source for these experiments is the quasi-monochromatic Heα emission from metal foils heated to multi-keV temperatures. A critical aspect for understanding the sample's thermodynamic state is the amount of heating caused by absorption of the probe x-rays. In this work, we characterize the performance of the Ge foil x-ray source over more than 60 NIF x-ray diffraction experiments. We use this information to constrain the level of diffraction sample heating from the x-ray source and discuss the impact on the thermodynamic state.

Original languageEnglish (US)
Article number103302
JournalPhysics of Plasmas
Volume29
Issue number10
DOIs
StatePublished - Oct 1 2022

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics

Fingerprint

Dive into the research topics of 'X-ray source characterization and sample heating on x-ray diffraction experiments at the National Ignition Facility'. Together they form a unique fingerprint.

Cite this