X-ray diffraction analysis of quantum cascade lasers

Liwei Cheng; Ruth Choa; Jacob Khurgin; Fow Sen Choa; Xing Chen; Xiaojun Wang; Jenyu Fan; Jianxin Chen; Claire Gmachl

doi:10.1109/ICIPRM.2009.5012507

X-ray diffraction analysis of quantum cascade lasers

Liwei Cheng, Ruth Choa, Jacob Khurgin, Fow Sen Choa, Xing Chen, Xiaojun Wang, Jenyu Fan, Jianxin Chen, Claire Gmachl

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Growth quality of quantum-cascade-lasers (QCLs) is difficult to be characterized due to the demanding requirements on hetero-interface quality and thickness control for all >1000 nano-scale superlattice stucture. In this work we employ X-ray diffractometry (XRD) to effectively evaluate QCL-wafer growths.

Original language	English (US)
Title of host publication	IEEE International Conference on Indium Phosphide and Related Materials, IPRM 2009
Pages	267-269
Number of pages	3
DOIs	https://doi.org/10.1109/ICIPRM.2009.5012507
State	Published - 2009
Externally published	Yes
Event	IEEE International Conference on Indium Phosphide and Related Materials, IPRM 2009 - Newport Beach, CA, United States Duration: May 10 2009 → May 14 2009

Publication series

Name	Conference Proceedings - International Conference on Indium Phosphide and Related Materials
ISSN (Print)	1092-8669

Other

Other	IEEE International Conference on Indium Phosphide and Related Materials, IPRM 2009
Country/Territory	United States
City	Newport Beach, CA
Period	5/10/09 → 5/14/09

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

Access to Document

10.1109/ICIPRM.2009.5012507

Cite this

Cheng, L., Choa, R., Khurgin, J., Choa, F. S., Chen, X., Wang, X., Fan, J., Chen, J., & Gmachl, C. (2009). X-ray diffraction analysis of quantum cascade lasers. In IEEE International Conference on Indium Phosphide and Related Materials, IPRM 2009 (pp. 267-269). Article 5012507 (Conference Proceedings - International Conference on Indium Phosphide and Related Materials). https://doi.org/10.1109/ICIPRM.2009.5012507

@inproceedings{ccd906baeb234b79b91a1d078d032267,

title = "X-ray diffraction analysis of quantum cascade lasers",

abstract = "Growth quality of quantum-cascade-lasers (QCLs) is difficult to be characterized due to the demanding requirements on hetero-interface quality and thickness control for all >1000 nano-scale superlattice stucture. In this work we employ X-ray diffractometry (XRD) to effectively evaluate QCL-wafer growths.",

author = "Liwei Cheng and Ruth Choa and Jacob Khurgin and Choa, {Fow Sen} and Xing Chen and Xiaojun Wang and Jenyu Fan and Jianxin Chen and Claire Gmachl",

year = "2009",

doi = "10.1109/ICIPRM.2009.5012507",

language = "English (US)",

isbn = "9781424434336",

series = "Conference Proceedings - International Conference on Indium Phosphide and Related Materials",

pages = "267--269",

booktitle = "IEEE International Conference on Indium Phosphide and Related Materials, IPRM 2009",

note = "IEEE International Conference on Indium Phosphide and Related Materials, IPRM 2009 ; Conference date: 10-05-2009 Through 14-05-2009",

}

Cheng, L, Choa, R, Khurgin, J, Choa, FS, Chen, X, Wang, X, Fan, J, Chen, J & Gmachl, C 2009, X-ray diffraction analysis of quantum cascade lasers. in IEEE International Conference on Indium Phosphide and Related Materials, IPRM 2009., 5012507, Conference Proceedings - International Conference on Indium Phosphide and Related Materials, pp. 267-269, IEEE International Conference on Indium Phosphide and Related Materials, IPRM 2009, Newport Beach, CA, United States, 5/10/09. https://doi.org/10.1109/ICIPRM.2009.5012507

X-ray diffraction analysis of quantum cascade lasers. / Cheng, Liwei; Choa, Ruth; Khurgin, Jacob et al.
IEEE International Conference on Indium Phosphide and Related Materials, IPRM 2009. 2009. p. 267-269 5012507 (Conference Proceedings - International Conference on Indium Phosphide and Related Materials).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - X-ray diffraction analysis of quantum cascade lasers

AU - Cheng, Liwei

AU - Choa, Ruth

AU - Khurgin, Jacob

AU - Choa, Fow Sen

AU - Chen, Xing

AU - Wang, Xiaojun

AU - Fan, Jenyu

AU - Chen, Jianxin

AU - Gmachl, Claire

PY - 2009

Y1 - 2009

N2 - Growth quality of quantum-cascade-lasers (QCLs) is difficult to be characterized due to the demanding requirements on hetero-interface quality and thickness control for all >1000 nano-scale superlattice stucture. In this work we employ X-ray diffractometry (XRD) to effectively evaluate QCL-wafer growths.

AB - Growth quality of quantum-cascade-lasers (QCLs) is difficult to be characterized due to the demanding requirements on hetero-interface quality and thickness control for all >1000 nano-scale superlattice stucture. In this work we employ X-ray diffractometry (XRD) to effectively evaluate QCL-wafer growths.

UR - http://www.scopus.com/inward/record.url?scp=70349554504&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=70349554504&partnerID=8YFLogxK

U2 - 10.1109/ICIPRM.2009.5012507

DO - 10.1109/ICIPRM.2009.5012507

M3 - Conference contribution

AN - SCOPUS:70349554504

SN - 9781424434336

T3 - Conference Proceedings - International Conference on Indium Phosphide and Related Materials

SP - 267

EP - 269

BT - IEEE International Conference on Indium Phosphide and Related Materials, IPRM 2009

T2 - IEEE International Conference on Indium Phosphide and Related Materials, IPRM 2009

Y2 - 10 May 2009 through 14 May 2009

ER -

X-ray diffraction analysis of quantum cascade lasers

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All Science Journal Classification (ASJC) codes

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