Wide-band THz Spectroscope in Silicon THz Combining Sub-wavelength Near-field Sensing and Robust Regression Analysis

Xue Wu, Huaixi Lu, Kaushik Sengupta

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

In this paper, we present a method to miniaturize THz spectroscopic receivers into chip-scale systems by eliminating traditional spectrum analysis components such as wideband tunable THz sources, frequency multipliers, nonlinear mixing and amplifiers. This is achieved by extracting incident THz spectral signatures from the current distribution impressed on the surface of an on-chip antenna under the THz field incidence. A log-periodic tooth antenna is converted from a classical single port antenna into a massively multi-port structure with 84 detectors that sense the 2D current distribution. This method converts THz spectroscopy into a linear estimation problem and we apply robust estimation techniques such as LASSO, typically used in machine learning, to extract spectral signatures with noisy detectors with high sensitivity. The paper presents analytical and experimental results for the single chip operating at room temperature across 0.04-0.99 THz with 10 MHz accuracy in spectrum estimation of THz tones. The presented examples demonstrates that through a co-design approach of THz electromagnetics and electronics, such as by combining deep sub-wavelength near-field sensing and regression analyses, can enable a new class of THz chip-scale sensory systems.

Original languageEnglish (US)
Title of host publicationProceedings of the 2018 IEEE/MTT-S International Microwave Symposium, IMS 2018
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1468-1471
Number of pages4
ISBN (Print)9781538650677
DOIs
StatePublished - Aug 17 2018
Event2018 IEEE/MTT-S International Microwave Symposium, IMS 2018 - Philadelphia, United States
Duration: Jun 10 2018Jun 15 2018

Publication series

NameIEEE MTT-S International Microwave Symposium Digest
Volume2018-June
ISSN (Print)0149-645X

Other

Other2018 IEEE/MTT-S International Microwave Symposium, IMS 2018
CountryUnited States
CityPhiladelphia
Period6/10/186/15/18

All Science Journal Classification (ASJC) codes

  • Radiation
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Keywords

  • Detector
  • Spectroscopy
  • Terahertz
  • machine learning
  • submillimeter wave

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    Wu, X., Lu, H., & Sengupta, K. (2018). Wide-band THz Spectroscope in Silicon THz Combining Sub-wavelength Near-field Sensing and Robust Regression Analysis. In Proceedings of the 2018 IEEE/MTT-S International Microwave Symposium, IMS 2018 (pp. 1468-1471). [8439193] (IEEE MTT-S International Microwave Symposium Digest; Vol. 2018-June). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/MWSYM.2018.8439193