Voltage-dependent scanning-tunneling microscopy of a crystal surface: Graphite

A. Selloni, P. Carnevali, E. Tosatti, C. D. Chen

Research output: Contribution to journalArticle

268 Scopus citations

Abstract

We discuss the possible application of the scanning tunneling microscope (STM) to surface electronic spectroscopy, with an explicit calculation of the voltage-dependent tunneling current for an ideal STM experiment performed on graphite. We study how surface and bulk electronic states are reflected in the tunneling J-V spectra, and show that empty surface states of graphite may be well discriminated against bulklike structures by considering STM spectra at different tip-surface separations.

Original languageEnglish (US)
Pages (from-to)2602-2605
Number of pages4
JournalPhysical Review B
Volume31
Issue number4
DOIs
StatePublished - Jan 1 1985
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics

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