Abstract
We have investigated the channel-length dependence of responses to a vapor analyte with a series of α,ω-dihexylquarterthiophene (DHα4T) field-effect transistors (FETs). Single-crystalline DHα4T devices deposited by vacuum sublimation at substrate temperatures of 70°C are compared with polycrystalline DHα4T films deposited at room temperature. By changing the length of FET channels and/or the size of polymer grains, the number of grain boundaries per device is changed systematically. A larger response to vapor analyte is obtained by increasing the number of grain boundaries per device, showing that vapor sensing occurs mainly at grain boundaries.
Original language | English (US) |
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Pages (from-to) | 3079-3081 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 81 |
Issue number | 16 |
DOIs | |
State | Published - Oct 14 2002 |
All Science Journal Classification (ASJC) codes
- Physics and Astronomy (miscellaneous)