TY - JOUR
T1 - Valid t-Ratio Inference for IV
AU - Lee, David S.
AU - McCrary, Justin
AU - Moreira, Marcelo J.
AU - Porter, Jack
N1 - Publisher Copyright:
© 2022 American Economic Association. All rights reserved.
PY - 2022/10
Y1 - 2022/10
N2 - In the single-IV model, researchers commonly rely on t-ratio-based inference, even though the literature has quantified its potentially severe large-sample distortions. Building on Stock and Yogo (2005), we introduce the tF critical value function, leading to a standard error adjustment that is a smooth function of the first-stage F-statistic. For one-quarter of specifications in 61 AER papers, corrected standard errors are at least 49 and 136 percent larger than conventional 2SLS standard errors at the 5 percent and 1 percent significance levels, respectively. tF confidence intervals have shorter expected length than those of Anderson and Rubin (1949), whenever both are bounded.
AB - In the single-IV model, researchers commonly rely on t-ratio-based inference, even though the literature has quantified its potentially severe large-sample distortions. Building on Stock and Yogo (2005), we introduce the tF critical value function, leading to a standard error adjustment that is a smooth function of the first-stage F-statistic. For one-quarter of specifications in 61 AER papers, corrected standard errors are at least 49 and 136 percent larger than conventional 2SLS standard errors at the 5 percent and 1 percent significance levels, respectively. tF confidence intervals have shorter expected length than those of Anderson and Rubin (1949), whenever both are bounded.
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U2 - 10.1257/aer.20211063
DO - 10.1257/aer.20211063
M3 - Article
AN - SCOPUS:85139542870
SN - 0002-8282
VL - 112
SP - 3260
EP - 3290
JO - American Economic Review
JF - American Economic Review
IS - 10
ER -