USE OF SECONDARY EMISSIVE CAPACITIVE PROBES TO DETERMINE PLASMA POTENTIAL - A NEW DIAGNOSTIC TECHNIQUE.

N. Hershkowitz; E. Y. Wang; D. Diebold; T. Intrator; R. Majeski; H. Persing; G. Severn; B. Nelson; Y. J. Wen

USE OF SECONDARY EMISSIVE CAPACITIVE PROBES TO DETERMINE PLASMA POTENTIAL - A NEW DIAGNOSTIC TECHNIQUE.

N. Hershkowitz
, E. Y. Wang
, D. Diebold
, T. Intrator
, R. Majeski
, H. Persing
, G. Severn
, B. Nelson
, Y. J. Wen

Research output: Contribution to conference › Paper › peer-review

Abstract

The authors discuss a plasma potential diagnostic technique that is suitable for use in plasmas in which the electron temperature is greater than 40-50 eV. The technique is based on secondary electron emission by plasma electrons. This secondary-emission capacitive probe is much less sensitive to electron-temperature variations than conventional nonemitting floating probes.

Original language	English (US)
Pages	73
Number of pages	1
State	Published - 1987
Externally published	Yes

All Science Journal Classification (ASJC) codes

General Engineering

Cite this

@conference{d4ed0ba5f8894ee3898acb740e2a0c0a,

title = "USE OF SECONDARY EMISSIVE CAPACITIVE PROBES TO DETERMINE PLASMA POTENTIAL - A NEW DIAGNOSTIC TECHNIQUE.",

abstract = "The authors discuss a plasma potential diagnostic technique that is suitable for use in plasmas in which the electron temperature is greater than 40-50 eV. The technique is based on secondary electron emission by plasma electrons. This secondary-emission capacitive probe is much less sensitive to electron-temperature variations than conventional nonemitting floating probes.",

author = "N. Hershkowitz and Wang, \{E. Y.\} and D. Diebold and T. Intrator and R. Majeski and H. Persing and G. Severn and B. Nelson and Wen, \{Y. J.\}",

year = "1987",

language = "English (US)",

pages = "73",

}

TY - CONF

T1 - USE OF SECONDARY EMISSIVE CAPACITIVE PROBES TO DETERMINE PLASMA POTENTIAL - A NEW DIAGNOSTIC TECHNIQUE.

AU - Hershkowitz, N.

AU - Wang, E. Y.

AU - Diebold, D.

AU - Intrator, T.

AU - Majeski, R.

AU - Persing, H.

AU - Severn, G.

AU - Nelson, B.

AU - Wen, Y. J.

PY - 1987

Y1 - 1987

N2 - The authors discuss a plasma potential diagnostic technique that is suitable for use in plasmas in which the electron temperature is greater than 40-50 eV. The technique is based on secondary electron emission by plasma electrons. This secondary-emission capacitive probe is much less sensitive to electron-temperature variations than conventional nonemitting floating probes.

AB - The authors discuss a plasma potential diagnostic technique that is suitable for use in plasmas in which the electron temperature is greater than 40-50 eV. The technique is based on secondary electron emission by plasma electrons. This secondary-emission capacitive probe is much less sensitive to electron-temperature variations than conventional nonemitting floating probes.

UR - https://www.scopus.com/pages/publications/0023601279

UR - https://www.scopus.com/pages/publications/0023601279#tab=citedBy

M3 - Paper

AN - SCOPUS:0023601279

SP - 73

ER -

USE OF SECONDARY EMISSIVE CAPACITIVE PROBES TO DETERMINE PLASMA POTENTIAL - A NEW DIAGNOSTIC TECHNIQUE.

Abstract

All Science Journal Classification (ASJC) codes

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