Tunneling magnetoresistance in exchange biased ferromagnetic semiconductor tunnel junctions

Meng Zhu; Mark Wilson; Partha Mitra; Peter Schiffer; Nitin Samarth

doi:10.1109/DRC.2008.4800816

Tunneling magnetoresistance in exchange biased ferromagnetic semiconductor tunnel junctions

Meng Zhu, Mark Wilson, Partha Mitra, Peter Schiffer, Nitin Samarth

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English (US)
Title of host publication	66th DRC Device Research Conference Digest, DRC 2008
Pages	229-230
Number of pages	2
DOIs	https://doi.org/10.1109/DRC.2008.4800816
State	Published - 2008
Externally published	Yes
Event	66th DRC Device Research Conference Digest, DRC 2008 - Santa Barbara, CA, United States Duration: Jun 23 2008 → Jun 25 2008

Publication series

Name	Device Research Conference - Conference Digest, DRC
ISSN (Print)	1548-3770

Other

Other	66th DRC Device Research Conference Digest, DRC 2008
Country/Territory	United States
City	Santa Barbara, CA
Period	6/23/08 → 6/25/08

All Science Journal Classification (ASJC) codes

Electrical and Electronic Engineering

Access to Document

10.1109/DRC.2008.4800816

Cite this

@inproceedings{8150e7b43a2b45c49cdf7774bc6255a8,

title = "Tunneling magnetoresistance in exchange biased ferromagnetic semiconductor tunnel junctions",

author = "Meng Zhu and Mark Wilson and Partha Mitra and Peter Schiffer and Nitin Samarth",

year = "2008",

doi = "10.1109/DRC.2008.4800816",

language = "English (US)",

isbn = "9781424419425",

series = "Device Research Conference - Conference Digest, DRC",

pages = "229--230",

booktitle = "66th DRC Device Research Conference Digest, DRC 2008",

note = "66th DRC Device Research Conference Digest, DRC 2008 ; Conference date: 23-06-2008 Through 25-06-2008",

}

Zhu, M, Wilson, M, Mitra, P, Schiffer, P & Samarth, N 2008, Tunneling magnetoresistance in exchange biased ferromagnetic semiconductor tunnel junctions. in 66th DRC Device Research Conference Digest, DRC 2008., 4800816, Device Research Conference - Conference Digest, DRC, pp. 229-230, 66th DRC Device Research Conference Digest, DRC 2008, Santa Barbara, CA, United States, 6/23/08. https://doi.org/10.1109/DRC.2008.4800816

TY - GEN

T1 - Tunneling magnetoresistance in exchange biased ferromagnetic semiconductor tunnel junctions

AU - Zhu, Meng

AU - Wilson, Mark

AU - Mitra, Partha

AU - Schiffer, Peter

AU - Samarth, Nitin

PY - 2008

Y1 - 2008

UR - http://www.scopus.com/inward/record.url?scp=64849108791&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=64849108791&partnerID=8YFLogxK

U2 - 10.1109/DRC.2008.4800816

DO - 10.1109/DRC.2008.4800816

M3 - Conference contribution

AN - SCOPUS:64849108791

SN - 9781424419425

T3 - Device Research Conference - Conference Digest, DRC

SP - 229

EP - 230

BT - 66th DRC Device Research Conference Digest, DRC 2008

T2 - 66th DRC Device Research Conference Digest, DRC 2008

Y2 - 23 June 2008 through 25 June 2008

ER -

Tunneling magnetoresistance in exchange biased ferromagnetic semiconductor tunnel junctions

Publication series

Other

All Science Journal Classification (ASJC) codes

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