Trace-Gas Spectroscopy of Methane Using a Monolithically Integrated Silicon Photonic Chip Sensor

Eric J. Zhang, Yves Martin, Jason S. Orcutt, Chi Xiong, Martin Glodde, Tymon Barwicz, Laurent Schares, Elizabeth A. Duch, Nathan Marchack, Chu C. Teng, Gerard Wysocki, William M.J. Green

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

We present a monolithically integrated photonic sensor incorporating an on-chip 111- V laser, detector, sealed reference cell, and sensing waveguide capable of near-infrared absorption spectroscopy of methane near λ = 1651 nm. Sub-100 pprnv-Hz-1/2 sensitivities are demonstrated.

Original languageEnglish (US)
Title of host publication2019 Conference on Lasers and Electro-Optics, CLEO 2019 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781943580576
DOIs
StatePublished - May 2019
Event2019 Conference on Lasers and Electro-Optics, CLEO 2019 - San Jose, United States
Duration: May 5 2019May 10 2019

Publication series

Name2019 Conference on Lasers and Electro-Optics, CLEO 2019 - Proceedings

Conference

Conference2019 Conference on Lasers and Electro-Optics, CLEO 2019
CountryUnited States
CitySan Jose
Period5/5/195/10/19

All Science Journal Classification (ASJC) codes

  • Spectroscopy
  • Industrial and Manufacturing Engineering
  • Safety, Risk, Reliability and Quality
  • Management, Monitoring, Policy and Law
  • Electronic, Optical and Magnetic Materials
  • Radiology Nuclear Medicine and imaging
  • Instrumentation
  • Atomic and Molecular Physics, and Optics

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  • Cite this

    Zhang, E. J., Martin, Y., Orcutt, J. S., Xiong, C., Glodde, M., Barwicz, T., Schares, L., Duch, E. A., Marchack, N., Teng, C. C., Wysocki, G., & Green, W. M. J. (2019). Trace-Gas Spectroscopy of Methane Using a Monolithically Integrated Silicon Photonic Chip Sensor. In 2019 Conference on Lasers and Electro-Optics, CLEO 2019 - Proceedings [8749758] (2019 Conference on Lasers and Electro-Optics, CLEO 2019 - Proceedings). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.23919/CLEO.2019.8749758