TOTAL STUCK-AT-FAULT TESTING BY CIRCUIT TRANSFORMATION.

Andrea S. LaPaugh; Richard J. Lipton

doi:10.1109/dac.1983.1585733

TOTAL STUCK-AT-FAULT TESTING BY CIRCUIT TRANSFORMATION.

Andrea S. LaPaugh, Richard J. Lipton

Computer Science

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English (US)
Title of host publication	Proceedings - Design Automation Conference
Publisher	IEEE, USA. Available form IEEE Service Cent
Pages	713-716
Number of pages	4
ISBN (Print)	0818600268, 9780818600265
DOIs	https://doi.org/10.1109/dac.1983.1585733
State	Published - 1983

Publication series

Name	Proceedings - Design Automation Conference
ISSN (Print)	0146-7123

All Science Journal Classification (ASJC) codes

General Engineering

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10.1109/dac.1983.1585733

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@inproceedings{dc389b274f844e048bb370b05697aa7a,

title = "TOTAL STUCK-AT-FAULT TESTING BY CIRCUIT TRANSFORMATION.",

author = "LaPaugh, \{Andrea S.\} and Lipton, \{Richard J.\}",

year = "1983",

doi = "10.1109/dac.1983.1585733",

language = "English (US)",

isbn = "0818600268",

series = "Proceedings - Design Automation Conference",

publisher = "IEEE, USA. Available form IEEE Service Cent",

pages = "713--716",

booktitle = "Proceedings - Design Automation Conference",

}

TY - GEN

T1 - TOTAL STUCK-AT-FAULT TESTING BY CIRCUIT TRANSFORMATION.

AU - LaPaugh, Andrea S.

AU - Lipton, Richard J.

PY - 1983

Y1 - 1983

UR - https://www.scopus.com/pages/publications/0020588022

UR - https://www.scopus.com/inward/citedby.url?scp=0020588022&partnerID=8YFLogxK

U2 - 10.1109/dac.1983.1585733

DO - 10.1109/dac.1983.1585733

M3 - Conference contribution

AN - SCOPUS:0020588022

SN - 0818600268

SN - 9780818600265

T3 - Proceedings - Design Automation Conference

SP - 713

EP - 716

BT - Proceedings - Design Automation Conference

PB - IEEE, USA. Available form IEEE Service Cent

ER -

TOTAL STUCK-AT-FAULT TESTING BY CIRCUIT TRANSFORMATION.

Publication series

All Science Journal Classification (ASJC) codes

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