TOTAL STUCK-AT-FAULT TESTING BY CIRCUIT TRANSFORMATION.

Andrea S. LaPaugh, Richard J. Lipton

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish (US)
Title of host publicationProceedings - Design Automation Conference
PublisherIEEE, USA. Available form IEEE Service Cent
Pages713-716
Number of pages4
ISBN (Print)0818600268
StatePublished - Jan 1 1983

Publication series

NameProceedings - Design Automation Conference
ISSN (Print)0146-7123

All Science Journal Classification (ASJC) codes

  • Engineering(all)

Fingerprint Dive into the research topics of 'TOTAL STUCK-AT-FAULT TESTING BY CIRCUIT TRANSFORMATION.'. Together they form a unique fingerprint.

Cite this