| Original language | English (US) |
|---|---|
| Title of host publication | Digest of Papers - International Test Conference |
| Publisher | IEEE |
| Pages | 428-434 |
| Number of pages | 7 |
| ISBN (Print) | 0818605022 |
| State | Published - 1983 |
Publication series
| Name | Digest of Papers - International Test Conference |
|---|
All Science Journal Classification (ASJC) codes
- General Engineering
Fingerprint
Dive into the research topics of 'TOTAL FAULT TESTING USING THE BIPARTITE TRANSFORMATION.'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver