Tomographic imaging based on scattered radiation from polyethylene using 10, 15, 20, 25 and 30 keV synchrotron X-rays with simple approximations

D. V. Rao; T. Yuasa; T. Akatsuka; G. Tromba; M. Zahid Hasan; T. Takeda

doi:10.1016/j.nimb.2005.05.049

Tomographic imaging based on scattered radiation from polyethylene using 10, 15, 20, 25 and 30 keV synchrotron X-rays with simple approximations

D. V. Rao, T. Yuasa, T. Akatsuka, G. Tromba, M. Zahid Hasan, T. Takeda

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Abstract

Tomographic imaging based on scattered radiation from polyethylene (C ₅H₈O₂), is evaluated, using 10, 15, 20, 25 and 30 keV synchrotron X-rays. The SYRMEP facility at Elettra, Trieste, Italy, has been used to detect the scattered radiation from the sample at an angle of 90° using Si-Pin detector coupled to a multi-channel analyzer. The contribution of transmitted, Compton and fluorescence photons are assessed from a test phantom of small dimensions with simple approximations. The optimum analysis is performed with the use of the dimensions of the sample by detecting the radiation at various energies.

Original language	English (US)
Pages (from-to)	209-216
Number of pages	8
Journal	Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume	239
Issue number	3
DOIs	https://doi.org/10.1016/j.nimb.2005.05.049
State	Published - Sep 2005

All Science Journal Classification (ASJC) codes

Nuclear and High Energy Physics
Instrumentation

Keywords

Compton
Fluorescence photons
Optimum energy
Polyethylene
Rayleigh
Scattered radiation
Simple approximations
Synchrotron X-rays
Tomography

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10.1016/j.nimb.2005.05.049

Cite this

Rao, D. V., Yuasa, T., Akatsuka, T., Tromba, G., Hasan, M. Z., & Takeda, T. (2005). Tomographic imaging based on scattered radiation from polyethylene using 10, 15, 20, 25 and 30 keV synchrotron X-rays with simple approximations. Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 239(3), 209-216. https://doi.org/10.1016/j.nimb.2005.05.049

@article{262b3e562c7342d4a955c804eb65f2cf,

title = "Tomographic imaging based on scattered radiation from polyethylene using 10, 15, 20, 25 and 30 keV synchrotron X-rays with simple approximations",

abstract = "Tomographic imaging based on scattered radiation from polyethylene (C 5H8O2), is evaluated, using 10, 15, 20, 25 and 30 keV synchrotron X-rays. The SYRMEP facility at Elettra, Trieste, Italy, has been used to detect the scattered radiation from the sample at an angle of 90° using Si-Pin detector coupled to a multi-channel analyzer. The contribution of transmitted, Compton and fluorescence photons are assessed from a test phantom of small dimensions with simple approximations. The optimum analysis is performed with the use of the dimensions of the sample by detecting the radiation at various energies.",

keywords = "Compton, Fluorescence photons, Optimum energy, Polyethylene, Rayleigh, Scattered radiation, Simple approximations, Synchrotron X-rays, Tomography",

author = "Rao, {D. V.} and T. Yuasa and T. Akatsuka and G. Tromba and Hasan, {M. Zahid} and T. Takeda",

year = "2005",

month = sep,

doi = "10.1016/j.nimb.2005.05.049",

language = "English (US)",

volume = "239",

pages = "209--216",

journal = "Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms",

issn = "0168-583X",

publisher = "Elsevier",

number = "3",

}

Rao, DV, Yuasa, T, Akatsuka, T, Tromba, G, Hasan, MZ & Takeda, T 2005, 'Tomographic imaging based on scattered radiation from polyethylene using 10, 15, 20, 25 and 30 keV synchrotron X-rays with simple approximations', Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, vol. 239, no. 3, pp. 209-216. https://doi.org/10.1016/j.nimb.2005.05.049

Tomographic imaging based on scattered radiation from polyethylene using 10, 15, 20, 25 and 30 keV synchrotron X-rays with simple approximations. / Rao, D. V.; Yuasa, T.; Akatsuka, T. et al.
In: Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Vol. 239, No. 3, 09.2005, p. 209-216.

Research output: Contribution to journal › Article › peer-review

TY - JOUR

T1 - Tomographic imaging based on scattered radiation from polyethylene using 10, 15, 20, 25 and 30 keV synchrotron X-rays with simple approximations

AU - Rao, D. V.

AU - Yuasa, T.

AU - Akatsuka, T.

AU - Tromba, G.

AU - Hasan, M. Zahid

AU - Takeda, T.

PY - 2005/9

Y1 - 2005/9

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AB - Tomographic imaging based on scattered radiation from polyethylene (C 5H8O2), is evaluated, using 10, 15, 20, 25 and 30 keV synchrotron X-rays. The SYRMEP facility at Elettra, Trieste, Italy, has been used to detect the scattered radiation from the sample at an angle of 90° using Si-Pin detector coupled to a multi-channel analyzer. The contribution of transmitted, Compton and fluorescence photons are assessed from a test phantom of small dimensions with simple approximations. The optimum analysis is performed with the use of the dimensions of the sample by detecting the radiation at various energies.

KW - Compton

KW - Fluorescence photons

KW - Optimum energy

KW - Polyethylene

KW - Rayleigh

KW - Scattered radiation

KW - Simple approximations

KW - Synchrotron X-rays

KW - Tomography

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IS - 3

ER -

Tomographic imaging based on scattered radiation from polyethylene using 10, 15, 20, 25 and 30 keV synchrotron X-rays with simple approximations

Abstract

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