Tomographic imaging based on scattered radiation from polyethylene using 10, 15, 20, 25 and 30 keV synchrotron X-rays with simple approximations

D. V. Rao, T. Yuasa, T. Akatsuka, G. Tromba, MD Zahid Hasan, T. Takeda

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

Tomographic imaging based on scattered radiation from polyethylene (C 5H8O2), is evaluated, using 10, 15, 20, 25 and 30 keV synchrotron X-rays. The SYRMEP facility at Elettra, Trieste, Italy, has been used to detect the scattered radiation from the sample at an angle of 90° using Si-Pin detector coupled to a multi-channel analyzer. The contribution of transmitted, Compton and fluorescence photons are assessed from a test phantom of small dimensions with simple approximations. The optimum analysis is performed with the use of the dimensions of the sample by detecting the radiation at various energies.

Original languageEnglish (US)
Pages (from-to)209-216
Number of pages8
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume239
Issue number3
DOIs
StatePublished - Sep 1 2005

All Science Journal Classification (ASJC) codes

  • Nuclear and High Energy Physics
  • Instrumentation

Keywords

  • Compton
  • Fluorescence photons
  • Optimum energy
  • Polyethylene
  • Rayleigh
  • Scattered radiation
  • Simple approximations
  • Synchrotron X-rays
  • Tomography

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