Three-dimensional interface roughness in layered semiconductor structures and its effect on intersubband transitions

Alex Y. Song, Rajaram Bhat, Pierre Bouzi, Chung En Zah, Claire F. Gmachl

Research output: Contribution to journalArticlepeer-review

6 Scopus citations

Abstract

A general model for treating the effects of three-dimensional (3D) interface roughness (IFR) in layered semiconductor structures has been developed and experimentally verified. The configurational average of the IFR potential produces an effective grading potential in the out-of-plane direction, which significantly alters the energy spectrum of the structure. The scattering self-energy of the 3D IFR is also derived. Under strong IFR, this scattering effect is shown to be dominant over phonon interaction and impurity scattering. When applied to intersubband transitions, these theoretical predictions explain the experimentally observed anomalous energy shift and unusual broadening in the intersubband transitions in III-nitride superlattices.

Original languageEnglish (US)
Article number165307
JournalPhysical Review B
Volume94
Issue number16
DOIs
StatePublished - Oct 18 2016

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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