Thin-film circuits for scalable interfacing between large-area electronics and CMOS ICs

Tiffany Moy, Warren Rieutort-Louis, Yingzhe Hu, Liechao Huang, Josue Sanz-Robinson, James C. Sturm, Sigurd Wagner, Naveen Verma

Research output: Chapter in Book/Report/Conference proceedingConference contribution

21 Scopus citations

Abstract

Hybrid systems based on large-area electronics (LAE) and CMOS ICs aim to exploit the complementary strengths of the two technologies: the scalability of LAE for forming interconnects and transducers (for sensing and energy harvesting), and the energy efficiency of CMOS for instrumentation and computation. The viability of large-scale systems depends on maximizing the robustness and minimizing the number of interfaces between the LAE and CMOS domains. To maximize robustness, inductive and capacitive coupling has been explored, avoiding the need for metallurgical bonding [1]. To minimize the number of interfaces, a method to access and readout individual sensors via minimal coupling channels, is crucial. In this abstract, we present a thin-film transistor (TFT) based scanning circuit that requires only three capacitively-coupled control signals from the IC to sequentially access an arbitrarily large number of LAE sensors, enabling a single readout interface (Fig. 1). A key attribute of the presented circuit is the low power consumption, which remains nearly constant even as the number of sensors scales.

Original languageEnglish (US)
Title of host publication72nd Device Research Conference, DRC 2014 - Conference Digest
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages271-272
Number of pages2
ISBN (Print)9781479954056
DOIs
StatePublished - 2014
Event72nd Device Research Conference, DRC 2014 - Santa Barbara, CA, United States
Duration: Jun 22 2014Jun 25 2014

Publication series

NameDevice Research Conference - Conference Digest, DRC
ISSN (Print)1548-3770

Other

Other72nd Device Research Conference, DRC 2014
Country/TerritoryUnited States
CitySanta Barbara, CA
Period6/22/146/25/14

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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