Thermal characterization of test techniques for FinFET and 3D integrated circuits

Aoxiang Tang, Niraj K. Jha

Research output: Contribution to journalArticlepeer-review

6 Scopus citations

Fingerprint

Dive into the research topics of 'Thermal characterization of test techniques for FinFET and 3D integrated circuits'. Together they form a unique fingerprint.

Engineering

Keyphrases