The multi-optics high-resolution absorption x-ray spectrometer (HiRAXS) for studies of materials under extreme conditions

  • S. Stoupin
  • , D. B. Thorn
  • , N. Ose
  • , L. Gao
  • , K. W. Hill
  • , Y. Ping
  • , F. Coppari
  • , B. Kozioziemski
  • , A. Krygier
  • , H. Sio
  • , J. Ayers
  • , M. Bitter
  • , B. Kraus
  • , P. C. Efthimion
  • , M. B. Schneider

Research output: Contribution to journalArticlepeer-review

8 Scopus citations

Abstract

We report the development of a high-resolution spectrometer for extended x-ray absorption fine structure (EXAFS) studies of materials under extreme conditions. A curved crystal and detector in the spectrometer are replaceable such that a single body is employed to perform EXAFS measurements at different x-ray energy intervals of interest. Two configurations have been implemented using toroidal crystals with Ge 311 reflection set to provide EXAFS at the Cu K-edge (energy range 8.9-9.8 keV) and Ge 400 reflection set to provide EXAFS at the Ta L3-edge (9.8-10.7 keV). Key performance characteristics of the spectrometer were found to be consistent with design parameters. The data generated at the National Ignition Facility have shown an ≃3 eV spectral resolution for the Cu K-edge configuration and ≃6 eV for the Ta L3-edge configuration.

Original languageEnglish (US)
Article number053102
JournalReview of Scientific Instruments
Volume92
Issue number5
DOIs
StatePublished - May 1 2021

All Science Journal Classification (ASJC) codes

  • Instrumentation

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