@inproceedings{6b76e302151d46108f5a7d9f9aeed441,
title = "The impact of the dielectric / semiconductor interface on microstructure and charge carrier transport in high-performance polythiophene transistors",
abstract = "The performance of organic field-effect transistors (OFETs) significantly depends on the properties of the interface between the semiconductor and gate dielectric. Here, we study the impact of chemically modified and morphologically controlled dielectrics on the performance of poly(2,5-bis(3-alkylthiophen-2-yl) thieno[3,2-bjthiophene) (pBTTT) semiconductors. We find that the molecular packing, domain size, and carrier mobility of pBTTT are highly sensitive to dielectric chemistry and dielectric roughness. The large and well-oriented terraced domains that are the origin of pBTTTs high performance can develop well on certain dielectrics, but can be disrupted on others.",
author = "Youngsuk Jung and {Joseph Kline}, R. and Lin, {Eric K.} and Fischer, {Daniel A.} and Toney, {Michael F.} and Martin Heeney and Iain McCulloch and DeLongchamp, {Dean M.}",
year = "2008",
doi = "10.1149/1.2908623",
language = "English (US)",
isbn = "9781566776271",
series = "ECS Transactions",
number = "2",
pages = "113--122",
booktitle = "ECS Transactions - Dielectrics for Nanosystems 3",
edition = "2",
note = "3rd International Symposium on Dielectrics for Nanosystems: Materials Science, Processing, Reliability and Manufacturing - 213th ECS Meeting ; Conference date: 18-05-2008 Through 22-05-2008",
}