Skip to main navigation
Skip to search
Skip to main content
Princeton University Home
Help & FAQ
Home
Profiles
Research units
Facilities
Projects
Research output
Press/Media
Search by expertise, name or affiliation
The attachment length in orificed hollow cathodes
C. J. Wordingham
, P. Y.C.R. Taunay
,
E. Y. Choueiri
Mechanical & Aerospace Engineering
Research output
:
Contribution to journal
›
Article
›
peer-review
5
Scopus citations
Overview
Fingerprint
Fingerprint
Dive into the research topics of 'The attachment length in orificed hollow cathodes'. Together they form a unique fingerprint.
Sort by
Weight
Alphabetically
Engineering
Orifice
100%
Plasma Density
60%
Electron Temperature
60%
Two Dimensional
20%
Boundary Condition
20%
Length Scale
20%
Analytical Result
20%
Internals
20%
Diffusion Equation
20%
Partial Differential Equation
20%
Closed Form Solution
20%
Input Parameter
20%
Diameter Ratio
20%
Plasma Property
20%
Keyphrases
Pressure-diameter
50%
Ambipolar Diffusion Equation
25%
Two-dimensional Framework
25%
Cathode Life
25%
Chemical Engineering
Plasma Property
100%