Dynamic CMOS circuits are known to have area and speed advantages over static CMOS circuits. Zipper CMOS is a dynamic CMOS circuit technique which also provides protection against instability and charge-sharing problems. This is achieved by using a special driver circuit. In this paper we present a method for testing of zipper CMOS circuits. We first derive a gate-level model for the circuit and then obtain a single stuck-at fault test set for the model. We rearrange and possibly repeat some vectors in the test set so that it can be used to detect single stuck-open and stuck-on faults in addition to stuck-at faults in the zipper CMOS circuit. We also consider faults in the driver circuit.
All Science Journal Classification (ASJC) codes
- Electrical and Electronic Engineering