Abstract
A method for testing zipper CMOS circuits is presented. A gate-level model for the circuit is derived, and a single stuck-at fault test set for the model is obtained. Vectors are rearranged in the test set so that it can be used to detect single stuck-open and stuck-on faults in addition to stuck-at faults in the zipper CMOS circuit. Faults in the drive circuit are considered.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 9-12 |
| Number of pages | 4 |
| Journal | Proceedings - IEEE International Symposium on Circuits and Systems |
| Volume | 1 |
| State | Published - 1990 |
| Event | 1990 IEEE International Symposium on Circuits and Systems Part 4 (of 4) - New Orleans, LA, USA Duration: May 1 1990 → May 3 1990 |
All Science Journal Classification (ASJC) codes
- Electrical and Electronic Engineering