Testing of Multiple-Output Domino Logic (MODL) CMOS Circuits

Multiple-output domino logic (MODL) is a recently introduced dynamic CMOS logic in which complex gates can have multiple outputs for producing multiple functions. Depending on the degree of recurrence present in the circuit, this can result in a large reduction in the chip area required for implementing the circuit. Other advantages include higher speed, lower power requirement, and greater stability compared to conventional domino logic. In this paper we will present techniques for testing MODL circuits. We will show that due to the greater observability of MODL circuits, their test sets can be considerably smaller than those derived for the conventional domino CMOS circuits. We will derive tests for faults from a comprehensive fault model which includes stuck-at, stuck-open, and stuck-on faults. Test sets for MODL circuits are inherently robust in the presence of circuit delays and timing skews at the inputs. They are also well-protected against the charge distribution problem. Due to the above reasons, MODL should turn out to be an attractive CMOS logic technique.