Abstract
Multiple-output domino logic (MODL) is a dynamic CMOS logic in which complex gates can have multiple outputs for producing multiple functions. Techniques for testing MODL circuits are presented. It is shown that due to the greater observability of MODL circuits, their test sets can be considerably smaller than those derived for the conventional domino CMOS circuits. Tests for faults are derived from a comprehensive fault model which includes stuck-at, stuck-open, and stuck-on faults. Test sets for MODL circuits are inherently robust in the presence of circuit delays and timing-skews at the inputs.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 1-4 |
| Number of pages | 4 |
| Journal | Proceedings - IEEE International Symposium on Circuits and Systems |
| Volume | 1 |
| State | Published - 1990 |
| Event | 1990 IEEE International Symposium on Circuits and Systems Part 4 (of 4) - New Orleans, LA, USA Duration: May 1 1990 → May 3 1990 |
All Science Journal Classification (ASJC) codes
- Electrical and Electronic Engineering