TY - JOUR

T1 - Testing of Differential Cascode Voltage Switch One-Count Generators

AU - Jha, Niraj K.

N1 - Funding Information:
was supported in part by the National Science Foundation under Grant MIP-8815674 and in part by Siemens Corporation under Grant 170-4051.

PY - 1990/2

Y1 - 1990/2

N2 - - Clocked differential cascode voltage switch (DCVS) circuits are dynamic CMOS circuits which can implement both inverting and noninverting functions. They have protection against test-set invalidation due to timing skews at the inputs and circuit delays as well as due to charge distribution. We consider the problem of detecting stuck-at, stuck-open, and stuck-on faults in DCVS implementations of one-count generators. A one-count generator counts the number of one's in its inputs. It is made up of full adders and half-adders. If the number of inputs to the one-count generator is n, then the number of outputs k is given by [log2(n + 1)]. For a maximal DCVS one-count generator, for which n = 2k - 1, we show that the size of the test set is only four. For a nonmaximal DCVS one-count generator, for which n ≠ 2k -1, the upper bound on the size of the test set is 5(k - 1), in other words, the size is O(log2n). For a DCVS ripple-carry adder, which forms a part of the DCVS one-count generator, the test-set size is four.

AB - - Clocked differential cascode voltage switch (DCVS) circuits are dynamic CMOS circuits which can implement both inverting and noninverting functions. They have protection against test-set invalidation due to timing skews at the inputs and circuit delays as well as due to charge distribution. We consider the problem of detecting stuck-at, stuck-open, and stuck-on faults in DCVS implementations of one-count generators. A one-count generator counts the number of one's in its inputs. It is made up of full adders and half-adders. If the number of inputs to the one-count generator is n, then the number of outputs k is given by [log2(n + 1)]. For a maximal DCVS one-count generator, for which n = 2k - 1, we show that the size of the test set is only four. For a nonmaximal DCVS one-count generator, for which n ≠ 2k -1, the upper bound on the size of the test set is 5(k - 1), in other words, the size is O(log2n). For a DCVS ripple-carry adder, which forms a part of the DCVS one-count generator, the test-set size is four.

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U2 - 10.1109/4.50311

DO - 10.1109/4.50311

M3 - Article

AN - SCOPUS:0025387119

SN - 0018-9200

VL - 25

SP - 246

EP - 253

JO - IEEE Journal of Solid-State Circuits

JF - IEEE Journal of Solid-State Circuits

IS - 1

ER -