Testing Aspects of Nanotechnology Trends

Keyphrases

• Fault Tolerance 100%
• Nanotechnology 100%
• Carbon Nanotubes 100%
• Nanoscale Computing 100%
• Carbon Nanotube Field Effect Transistor (CNTFET) 100%
• Quantum-dot Cellular Automata 100%
• Nanoscale Devices 100%
• Resonant Tunneling Diode 100%
• High Density 50%
• Silicon Nanowires (SiNWs) 50%
• System Design 50%
• Imperfection 50%
• Test Generation Technique 50%
• Nanosystems 50%
• Silicon-carbon 50%
• Circuit-based 50%
• Circuit System 50%
• Variation Tolerance 50%
• Defect Characterization 50%
• Nanoscale Architecture 50%
• Logic Circuit 50%
• Nanoscale Circuits 50%
• Crossbar Array 50%
• Testability 50%
• Defect Rate 50%
• Array Architecture 50%
• Circuit Architecture 50%
• Test Generation 50%
• Fault Testing 50%
• Single-substrate 50%
• Built-in Self-test 50%
• Fault Modeling 50%

Material Science

• Carbon Nanotube 100%
• Electronic Circuit 75%
• Quantum Dot 50%
• Field Effect Transistor 50%
• Nanoscale Device 50%
• Density 25%
• Silicon 25%
• Nanowire 25%