Testing Aspects of Nanotechnology Trends

Keyphrases

• Nanoscale Computing 100%
• Carbon Nanotube Field Effect Transistor (CNTFET) 100%
• Quantum-dot Cellular Automata 100%
• Nanoscale Devices 100%
• Resonant Tunneling Diode 100%
• Silicon-carbon 50%
• Circuit-based 50%
• Circuit Architecture 50%
• Circuit System 50%
• Variation Tolerance 50%
• Built-in-self-test (BiST) 50%
• Defect Characterization 50%
• Single Substrate 50%
• Nanoscale Architecture 50%
• Logic Circuit 50%
• Nanoscale Circuits 50%
• Crossbar Array 50%
• Testability 50%
• Defect Rate 50%
• Array Architecture 50%

Material Science

• Carbon Nanotube 100%
• Electronic Circuit 75%
• Quantum Dot 50%
• Field Effect Transistor 50%
• Density 25%
• Silicon 25%
• Nanowire 25%

Engineering

• Field-Effect Transistor 40%
• Resonant Tunneling 40%
• Array Architecture 20%
• Logic Circuit 20%
• Built-in Self Test 20%