TY - GEN
T1 - Test generation for combinational Quantum Cellular Automata (QCA) circuits
AU - Gupta, Pallav
AU - Jha, Niraj K.
AU - Lingappan, Loganathan
PY - 2006
Y1 - 2006
N2 - In this paper, we present a test generation framework for testing of quantum cellular automata (QCA) circuits. QCA is a nanotechnology that has attracted significant recent attention and shows immense promise as a viable future technology. This work is motivated by the fact that the stuck-at fault test set of a circuit is not guaranteed to detect all defects that can occur in its QCA implementation. We show how to generate additional test vectors to supplement the stuck-at fault test set to guarantee that all simulated defects in the QCA gates get detected. Since nanotechnologies will be dominated by interconnects, we also target bridging faults on QCA interconnects. The efficacy of our framework is established through its application to QCA implementations of MCNC benchmarks that use majority gates as primitives.
AB - In this paper, we present a test generation framework for testing of quantum cellular automata (QCA) circuits. QCA is a nanotechnology that has attracted significant recent attention and shows immense promise as a viable future technology. This work is motivated by the fact that the stuck-at fault test set of a circuit is not guaranteed to detect all defects that can occur in its QCA implementation. We show how to generate additional test vectors to supplement the stuck-at fault test set to guarantee that all simulated defects in the QCA gates get detected. Since nanotechnologies will be dominated by interconnects, we also target bridging faults on QCA interconnects. The efficacy of our framework is established through its application to QCA implementations of MCNC benchmarks that use majority gates as primitives.
UR - http://www.scopus.com/inward/record.url?scp=34047182146&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=34047182146&partnerID=8YFLogxK
U2 - 10.1109/date.2006.244175
DO - 10.1109/date.2006.244175
M3 - Conference contribution
AN - SCOPUS:34047182146
SN - 3981080114
SN - 9783981080117
T3 - Proceedings -Design, Automation and Test in Europe, DATE
BT - Proceedings - Design, Automation and Test in Europe, DATE'06
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - Design, Automation and Test in Europe, DATE'06
Y2 - 6 March 2006 through 10 March 2006
ER -