Abstract
A set of schemes for locating objects of interest (color, variability, morphological form, etc.) by automated search of photographic plates is described. These techniques are designed to allow rapid and efficient processing of large areas of plate and to make minimal demands on the homogeneity and calibration of the plate material. They are based in part on the techniques of nonparametric statistics. Projects using these methods which are currently being carried out with the Princeton PDS microdensitometer and image processing system are also briefly described.
Original language | English (US) |
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Pages (from-to) | 194-196 |
Number of pages | 3 |
Journal | Proceedings of SPIE - The International Society for Optical Engineering |
Volume | 264 |
DOIs | |
State | Published - Nov 21 1980 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering