Computer Science
Regular Expression
100%
Testability Analysis
100%
Register-Transfer Level
100%
Test Generation
33%
Experimental Result
16%
Test Application Time
16%
Fault Coverage
16%
Application Specific Integrated Circuit
16%
Digital Signal Processor
16%
Unified Framework
16%
Data Controller
16%
Processor Instruction
16%
Test Framework
16%
Generation Time
16%
Benchmark Circuit
16%
Application Processor
16%
Multiplexer
16%
Engineering
Testability
100%
Regular Expression
100%
Experimental Result
11%
Symbolics
11%
Microprocessor Chips
11%
Digital Signal Processor
11%
Data Path
11%
Application Specific Integrated Circuit
11%
Design Style
11%
Test Framework
11%
Multiplexer
11%
Keyphrases
Tao
100%
Partial Tests
16%