TAO: Regular expression based high-level testability analysis and optimization

Keyphrases

• Regular Expressions 100%
• Testability Analysis 100%
• Testability 100%
• Application-specific Processors 33%
• Test Case Generation 33%
• Multiplexer 33%
• Microprocessor 33%
• Unified Framework 33%
• Register Transfer Level 33%
• Test Design 33%
• Testing Time 33%
• Fault Coverage 33%
• Bit-width 33%
• Novel Methodology 33%
• Application Specific Integrated Circuits 33%
• Gate Level 33%
• Digital Signal Processor 33%
• Benchmark Circuits 33%
• Partial Scan 33%
• Design Style 33%
• Testing Framework 33%
• Programmable Processor 33%
• Sequential Test 33%
• Test Case Generator 33%
• Testing Method 33%
• Circuit Application 33%
• Level Controller 33%
• Partial Tests 33%

Computer Science

• Regular Expression 100%
• Testability Analysis 100%
• Experimental Result 50%
• Test Generation 50%
• Test Application Time 50%
• Fault Coverage 50%
• Register-Transfer Level 50%
• Application Specific Integrated Circuit 50%
• Digital Signal Processor 50%
• Unified Framework 50%
• Data Controller 50%
• Processor Instruction 50%
• Test Framework 50%
• Benchmark Circuit 50%
• Application Processor 50%
• Multiplexer 50%

Engineering

• Testability 100%
• Regular Expression 100%
• Experimental Result 20%
• Symbolics 20%
• Microprocessor Chips 20%
• Digital Signal Processor 20%
• Data Path 20%
• Application Specific Integrated Circuit 20%
• Design Style 20%
• Test Framework 20%
• Multiplexer 20%