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Keyphrases
Application Specific Integrated Circuits
22%
Application-specific Processors
11%
Area Overhead
22%
Benchmark Circuits
11%
Bit-width
22%
Boolean Functions
11%
Built-in Self-test
100%
Circuit Application
11%
Controller
11%
Datapath Circuit
22%
Delay Constraint
11%
Digital Signal Processor
11%
Energy Overhead
11%
Enhancement Solutions
11%
High-level Fault Coverage
22%
Level Controller
11%
Microprocessor
11%
Minimal Area
11%
Phased Approach
11%
Programmable Processor
11%
Register Transfer Level
100%
Regular Expressions
22%
Test Framework
11%
Testability
11%
Testability Analysis
100%
Testing Rates
11%
Computer Science
Application Processor
11%
Application Specific Integrated Circuit
22%
Benchmark Circuit
11%
Boolean Function
11%
build-in self-test
100%
Datapath
22%
Delay Constraint
11%
Digital Signal Processor
11%
Experimental Result
11%
Fault Coverage
22%
Microprocessor Chips
11%
Optical Spectrum
11%
Phased Approach
11%
Processor Instruction
11%
Register-Transfer Level
100%
Regular Expression
22%
Test Application Time
11%
Test Framework
11%
Testability Analysis
100%