Systematic evolution of temperature-dependent resistivity in La2-xSrxCuO4

H. Takagi, B. Batlogg, H. L. Kao, J. Kwo, Robert Joseph Cava, J. J. Krajewski, W. F. Peck

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Abstract

The in-plane resistivity (ab) of La2-xSrxCuO4 has been studied over a wide temperature (41000 K) and composition range (0<x<0.35). The much discussed T-linear resistivity is observed only in the narrow composition region associated with optimal superconductivity. In the underdoped range (x<0.1), we observe first indications of resistivity saturation and analyze the resistivity as indicative of a small Fermi surface. In the overdoped range (x>0.2), ab follows a novel power-law dependence, T1.5, over the entire temperature range up to 1000 K.

Original languageEnglish (US)
Pages (from-to)2975-2978
Number of pages4
JournalPhysical Review Letters
Volume69
Issue number20
DOIs
StatePublished - Jan 1 1992
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

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    Takagi, H., Batlogg, B., Kao, H. L., Kwo, J., Cava, R. J., Krajewski, J. J., & Peck, W. F. (1992). Systematic evolution of temperature-dependent resistivity in La2-xSrxCuO4. Physical Review Letters, 69(20), 2975-2978. https://doi.org/10.1103/PhysRevLett.69.2975