System for measuring auto- And cross correlation of current noise at low temperatures

L. Dicarlo; Y. Zhang; D. T. McClure; C. M. Marcus; L. N. Pfeiffer; K. W. West

doi:10.1063/1.2221541

System for measuring auto- And cross correlation of current noise at low temperatures

L. Dicarlo, Y. Zhang, D. T. McClure, C. M. Marcus, L. N. Pfeiffer, K. W. West

Research output: Contribution to journal › Article › peer-review

64 Scopus citations

Abstract

We describe the construction and operation of a two-channel noise detection system for measuring power and cross spectral densities of current fluctuations near 2 MHz in electronic devices at low temperatures. The system employs cryogenic amplification and fast Fourier transform based spectral measurement. The gain and electron temperature are calibrated using Johnson noise thermometry. Full shot noise of 100 pA can be resolved with an integration time of 10 s. We report a demonstration measurement of bias-dependent current noise in a gate defined GaAs/AlGaAs quantum point contact.

Original language	English (US)
Article number	073906
Journal	Review of Scientific Instruments
Volume	77
Issue number	7
DOIs	https://doi.org/10.1063/1.2221541
State	Published - 2006
Externally published	Yes

All Science Journal Classification (ASJC) codes

Instrumentation

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10.1063/1.2221541

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abstract = "We describe the construction and operation of a two-channel noise detection system for measuring power and cross spectral densities of current fluctuations near 2 MHz in electronic devices at low temperatures. The system employs cryogenic amplification and fast Fourier transform based spectral measurement. The gain and electron temperature are calibrated using Johnson noise thermometry. Full shot noise of 100 pA can be resolved with an integration time of 10 s. We report a demonstration measurement of bias-dependent current noise in a gate defined GaAs/AlGaAs quantum point contact.",

author = "L. Dicarlo and Y. Zhang and McClure, {D. T.} and Marcus, {C. M.} and Pfeiffer, {L. N.} and West, {K. W.}",

year = "2006",

doi = "10.1063/1.2221541",

language = "English (US)",

volume = "77",

journal = "Review of Scientific Instruments",

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AU - Dicarlo, L.

AU - Zhang, Y.

AU - McClure, D. T.

AU - Marcus, C. M.

AU - Pfeiffer, L. N.

AU - West, K. W.

PY - 2006

Y1 - 2006

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AB - We describe the construction and operation of a two-channel noise detection system for measuring power and cross spectral densities of current fluctuations near 2 MHz in electronic devices at low temperatures. The system employs cryogenic amplification and fast Fourier transform based spectral measurement. The gain and electron temperature are calibrated using Johnson noise thermometry. Full shot noise of 100 pA can be resolved with an integration time of 10 s. We report a demonstration measurement of bias-dependent current noise in a gate defined GaAs/AlGaAs quantum point contact.

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JF - Review of Scientific Instruments

IS - 7

M1 - 073906

ER -

System for measuring auto- And cross correlation of current noise at low temperatures

Abstract

All Science Journal Classification (ASJC) codes

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