Surface Oxidation of Bi2(Te,Se)3Topological Insulators Depends on Cleavage Accuracy

Conor R. Thomas, Matthew K. Vallon, Matthew G. Frith, Hikmet Sezen, Satya K. Kushwaha, Robert J. Cava, Jeffrey Schwartz, Steven L. Bernasek

Research output: Contribution to journal › Article › peer-review

47 Scopus citations

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Physics

Engineering

Material Science