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Superior imaging resolution in scanning helium-ion microscopy: A look at beam-sample interactions
David Cohen-Tanugi,
Nan Yao
Princeton Institute for the Science and Technology of Materials
Research output
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Contribution to journal
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Article
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peer-review
22
Scopus citations
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Physics & Astronomy
helium ions
100%
microscopy
58%
scanning
52%
interactions
33%
inelastic collisions
19%
stopping power
19%
secondary emission
19%
electronics
17%
gallium
17%
electron emission
16%
signal to noise ratios
13%
penetration
13%
spatial resolution
13%
scanning electron microscopy
10%
physics
10%
high resolution
10%
energy
9%
ions
7%
performance
7%
simulation
6%