Stress evolution and notch formation during polysilicon gate electrode etching

Michael A. Vyvoda, David B. Graves

Research output: Contribution to journalConference articlepeer-review

1 Scopus citations

Fingerprint

Dive into the research topics of 'Stress evolution and notch formation during polysilicon gate electrode etching'. Together they form a unique fingerprint.

Engineering

Material Science

Keyphrases

Chemical Engineering