Lattice strain measurements under nonhydrostatic compression in a diamond anvil cell were used to examine dense SiO2. Experiments were performed using energy dispersive x-ray diffraction and solid-state Ge detector fixed at 2θ=12°. The collecting time was 5-30 min for each spectrum. Spectra were collected only after sufficient time elapsed after pressurization such that stress relaxation was observed to be negligible. The data were analyzed using lattice strain theory.
|Original language||English (US)|
|Journal||Physical Review Letters|
|State||Published - Dec 16 2002|
All Science Journal Classification (ASJC) codes
- Physics and Astronomy(all)