Skip to main navigation
Skip to search
Skip to main content
Princeton University Home
Help & FAQ
Home
Profiles
Research units
Facilities
Projects
Research output
Press/Media
Search by expertise, name or affiliation
Spatially resolved spectra from a new x-ray imaging crystal spectrometer for measurements of ion and electron temperature profiles (invited)
M. Bitter
, K. W. Hill
,
B. Stratton
, A. L. Roquemore
, D. Mastrovito
, S. G. Lee
, J. G. Bak
, M. K. Moon
, U. W. Nam
, G. Smith
, J. E. Rice
, P. Beiersdorfer
, B. S. Fraenkel
PPPL NSTX
Research output
:
Contribution to journal
›
Article
›
peer-review
79
Scopus citations
Overview
Fingerprint
Fingerprint
Dive into the research topics of 'Spatially resolved spectra from a new x-ray imaging crystal spectrometer for measurements of ion and electron temperature profiles (invited)'. Together they form a unique fingerprint.
Sort by
Weight
Alphabetically
Keyphrases
Neutral Beam
100%
Ion Temperature
100%
Electron Temperature Profile
100%
Spatially Resolved Spectra
100%
Crystal Spectrometer
100%
Tokamak
66%
Two Dimensional
33%
High-resolution
33%
Radius of Curvature
33%
Line-of-sight
33%
Spatial Resolution
33%
Helium
33%
Argon
33%
Temperature Profile
33%
Spectrometer
33%
Quartz Crystal
33%
Tokamak Plasma
33%
International Thermonuclear Experimental Reactor
33%
Krypton
33%
Superconducting Tokamak
33%
Position Sensitive Detector
33%
Ohmic Heating
33%
Charge Exchange Spectroscopy
33%
Prototype Instrument
33%
Advanced Research
33%
Bragg Angle
33%
Physics
Electron Energy
100%
Tokamak Device
100%
Temperature Profile
100%
Ion Temperature
100%
Spectrometer
100%
Neutral Beams
75%
Detectors
50%
High Resolution
25%
Quartz Crystal
25%
Bragg Angle
25%