Spatial resolution study and power calibration of the high-k scattering system on NSTX

W. Lee; H. K. Park; M. H. Cho; W. Namkung; D. R. Smith; C. W. Domier; N. C. Luhmann

doi:10.1063/1.2969404

Spatial resolution study and power calibration of the high-k scattering system on NSTX

W. Lee, H. K. Park, M. H. Cho, W. Namkung, D. R. Smith, C. W. Domier, N. C. Luhmann

Plasma Physics Lab

Research output: Contribution to journal › Article › peer-review

4 Scopus citations

Abstract

NSTX high- k scattering system has been extensively utilized in studying the microturbulence and coherent waves. An absolute calibration of the scattering system was performed employing a new millimeter-wave source and calibrated attenuators. One of the key parameters essential for the calibration of the multichannel scattering system is the interaction length. This interaction length is significantly different from the conventional one due to the curvature and magnetic shear effect.

Original language	English (US)
Article number	10E723
Journal	Review of Scientific Instruments
Volume	79
Issue number	10
DOIs	https://doi.org/10.1063/1.2969404
State	Published - 2008

All Science Journal Classification (ASJC) codes

Instrumentation

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10.1063/1.2969404

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abstract = "NSTX high- k scattering system has been extensively utilized in studying the microturbulence and coherent waves. An absolute calibration of the scattering system was performed employing a new millimeter-wave source and calibrated attenuators. One of the key parameters essential for the calibration of the multichannel scattering system is the interaction length. This interaction length is significantly different from the conventional one due to the curvature and magnetic shear effect.",

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journal = "Review of Scientific Instruments",

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AU - Lee, W.

AU - Park, H. K.

AU - Cho, M. H.

AU - Namkung, W.

AU - Smith, D. R.

AU - Domier, C. W.

AU - Luhmann, N. C.

PY - 2008

Y1 - 2008

N2 - NSTX high- k scattering system has been extensively utilized in studying the microturbulence and coherent waves. An absolute calibration of the scattering system was performed employing a new millimeter-wave source and calibrated attenuators. One of the key parameters essential for the calibration of the multichannel scattering system is the interaction length. This interaction length is significantly different from the conventional one due to the curvature and magnetic shear effect.

AB - NSTX high- k scattering system has been extensively utilized in studying the microturbulence and coherent waves. An absolute calibration of the scattering system was performed employing a new millimeter-wave source and calibrated attenuators. One of the key parameters essential for the calibration of the multichannel scattering system is the interaction length. This interaction length is significantly different from the conventional one due to the curvature and magnetic shear effect.

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JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

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ER -

Spatial resolution study and power calibration of the high-k scattering system on NSTX

Abstract

All Science Journal Classification (ASJC) codes

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