Spatial resolution of a spherical x-ray crystal spectrometer at various magnifications

Lan Gao, K. W. Hill, M. Bitter, P. C. Efthimion, L. Delgado-Aparicio, N. A. Pablant, E. O. Baronova, N. R. Pereira

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

A high spatial resolution of a few μm is often required for probing small-scale high-energy-density plasmas using high resolution x-ray imaging spectroscopy. This resolution can be achieved by adjusting system magnification to overcome the inherent limitation of the detector pixel size. Laboratory experiments on investigating the relation between spatial resolution and system magnification for a spherical crystal spectrometer are presented. Tungsten Lβ2 rays from a tungsten-target micro-focus x-ray tube were diffracted by a Ge 440 crystal, which was spherically bent to a radius of 223 mm, and imaged onto an x-ray CCD with 13-μm pixel size. The source-to-crystal (p) and crystal-to-detector (q) distances were varied to produce spatial magnifications (M = q/p) ranging from 2 to 10. The inferred instrumental spatial width reduces with increasing system magnification M. However, the experimental measurement at each M is larger than the theoretical value of pixel size divided by M. Future work will focus on investigating possible broadening mechanisms that limit the spatial resolution.

Original languageEnglish (US)
Article number11D611
JournalReview of Scientific Instruments
Volume87
Issue number11
DOIs
StatePublished - Nov 1 2016

All Science Journal Classification (ASJC) codes

  • Instrumentation

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