Soft X-ray microscopy and spectroscopy at the molecular environmental science beamline at the Advanced Light Source

H. Bluhm, K. Andersson, T. Araki, K. Benzerara, G. E. Brown, J. J. Dynes, S. Ghosal, M. K. Gilles, H. Ch Hansen, J. C. Hemminger, A. P. Hitchcock, G. Ketteler, A. L.D. Kilcoyne, E. Kneedler, J. R. Lawrence, G. G. Leppard, J. Majzlam, B. S. Mun, Satish Chandra Babu Myneni, A. NilssonH. Ogasawara, D. F. Ogletree, K. Pecher, M. Salmeron, D. K. Shuh, B. Tonner, T. Tyliszczak, T. Warwick, T. H. Yoon

Research output: Contribution to journalArticle

249 Scopus citations

Abstract

We present examples of the application of synchrotron-based spectroscopies and microscopies to environmentally relevant samples. The experiments were performed at the molecular environmental science beamline (11.0.2) at the Advanced Light Source, Lawrence Berkeley National Laboratory. Examples range from the study of water monolayers on Pt(1 1 1) single crystal surfaces using X-ray emission spectroscopy and the examination of alkali halide solution/water vapor interfaces using ambient pressure photoemission spectroscopy, to the investigation of actinides, river water biofilms, Al-containing colloids and mineral-bacteria suspensions using scanning transmission X-ray spectromicroscopy. The results of our experiments show that spectroscopy and microscopy in the soft X-ray energy range are excellent tools for the investigation of environmentally relevant samples under realistic conditions, i.e., with water or water vapor present at ambient temperature.

Original languageEnglish (US)
Pages (from-to)86-104
Number of pages19
JournalJournal of Electron Spectroscopy and Related Phenomena
Volume150
Issue number2-3
DOIs
StatePublished - Feb 1 2006

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Radiation
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Spectroscopy
  • Physical and Theoretical Chemistry

Keywords

  • Near-edge X-ray absorption fine structure
  • Scanning transmission X-ray microscopy
  • Water environmental science
  • X-ray emission spectroscopy
  • X-ray photoelectron spectroscopy

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    Bluhm, H., Andersson, K., Araki, T., Benzerara, K., Brown, G. E., Dynes, J. J., Ghosal, S., Gilles, M. K., Hansen, H. C., Hemminger, J. C., Hitchcock, A. P., Ketteler, G., Kilcoyne, A. L. D., Kneedler, E., Lawrence, J. R., Leppard, G. G., Majzlam, J., Mun, B. S., Myneni, S. C. B., ... Yoon, T. H. (2006). Soft X-ray microscopy and spectroscopy at the molecular environmental science beamline at the Advanced Light Source. Journal of Electron Spectroscopy and Related Phenomena, 150(2-3), 86-104. https://doi.org/10.1016/j.elspec.2005.07.005