Simultaneous determination of refractive index and size of spherical dielectric particles from light scattering data

Petr Chylek, Venkatachalam Ramaswamy, A. Ashkin, J. M. Dziedzic

Research output: Contribution to journalArticle

138 Scopus citations

Abstract

The diameter and refractive index of micrometer sized spherical dielectric particles are simultaneously deduced using the wavelength dependence of backscattering data from optically levitated particles. The accuracy of the results is set by experimental errors in the determination of the wavelength of backscatter resonance peaks and the ratio of slopes of specified peaks. At present the refractive index and diameter can be deduced with relative errors of 5 X 10 -5 . This represents the most accurate determination of absolute size and refractive index yet made by light scattering. A reduction of these errors by an order of magnitude is possible. We assume a priori knowledge of diameter and refractive index with accuracy of 10 -1 and 5 X 10 -3 , respectively.

Original languageEnglish (US)
Pages (from-to)2302-2307
Number of pages6
JournalApplied Optics
Volume22
Issue number15
DOIs
StatePublished - Jan 1 1983
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Simultaneous determination of refractive index and size of spherical dielectric particles from light scattering data'. Together they form a unique fingerprint.

  • Cite this