TY - JOUR
T1 - Simulations of ion velocity distribution functions taking into account both elastic and charge exchange collisions
AU - Wang, Huihui
AU - Sukhomlinov, Vladimir S.
AU - Kaganovich, Igor D.
AU - Mustafaev, Alexander S.
N1 - Publisher Copyright:
© 2017 IOP Publishing Ltd.
PY - 2017/2
Y1 - 2017/2
N2 - Based on accurate representation of the He+-He angular differential scattering cross sections consisting of both elastic and charge exchange collisions, we performed detailed numerical simulations of the ion velocity distribution functions (IVDF) by Monte Carlo collision method (MCC). The results of simulations are validated by comparison with the experimental data of the ion mobility and the transverse diffusion. The IVDF simulation study shows that due to significant effect of scattering in elastic collisions IVDF cannot be separated into product of two independent IVDFs in the transverse and parallel to the electric field directions.
AB - Based on accurate representation of the He+-He angular differential scattering cross sections consisting of both elastic and charge exchange collisions, we performed detailed numerical simulations of the ion velocity distribution functions (IVDF) by Monte Carlo collision method (MCC). The results of simulations are validated by comparison with the experimental data of the ion mobility and the transverse diffusion. The IVDF simulation study shows that due to significant effect of scattering in elastic collisions IVDF cannot be separated into product of two independent IVDFs in the transverse and parallel to the electric field directions.
KW - ion velocity distribution functions
KW - ion-atom angular differential cross section
KW - Monte Carlo collision method
UR - https://www.scopus.com/pages/publications/85012891984
UR - https://www.scopus.com/pages/publications/85012891984#tab=citedBy
U2 - 10.1088/1361-6595/26/2/024001
DO - 10.1088/1361-6595/26/2/024001
M3 - Article
AN - SCOPUS:85012891984
SN - 0963-0252
VL - 26
JO - Plasma Sources Science and Technology
JF - Plasma Sources Science and Technology
IS - 2
M1 - 024001
ER -