Simulations of 3-D domain wall structures in thin films

Using the Gauss-Seidel projection method developed in [4] and [17], we simulate the three dimensional domain wall structures for thin films at various thickness. We observe transition from Néel wall to cross-tie wall and to Bloch wall as the thickness is increased. Periodic structures for cross-tie wall are also studied. The results are in good agreement with the experimental observations. Hysteresis loops are calculated for samples of various sizes. In particular, we study the effect of cross-tie wall in the switching process. These simulations have demonstrated high efficiency of the Gauss-Seidel projection method.