Silicon vertex detector for the KEK Super B factory

T. Tsuboyama, H. Aihara, T. Arakawa, Y. Asano, T. Aso, A. Bakich, M. Barbero, T. Browder, M. C. Chang, Y. Chao, K. F. Chen, S. Chidzik, A. Chouvikov, Y. K. Choi, A. Das, J. Dalseno, S. Fratina, M. Friedl, Y. Fujiyama, J. HabaK. Hara, T. Hara, B. Harrop, K. Hayashi, M. Hazumi, D. Heffernan, T. Higuchi, T. Hirakawa, C. Irmler, H. Ishino, N. K. Joshi, S. Kajiwara, H. Kakuno, T. Kameshima, T. Kawasaki, A. Kibayashi, Y. J. Kim, S. Koike, S. Korpar, P. Križan, H. Kurashiro, A. Kusaka, D. Marlow, H. Miyake, G. R. Moloney, Y. Nakahama, Z. Natkaniec, S. Okuno, S. Ono, W. Ostrowicz, H. Ozaki, L. Peak, M. Pernicka, M. Rosen, M. Rozanska, N. Sato, S. Schmid, J. Schümann, S. Stanič, H. Steininger, K. Sumisawa, O. Tajima, T. Takahashi, N. Tamura, M. Tanaka, N. Tani, G. N. Taylor, K. Trabelsi, K. Uchida, K. Ueno, Y. Ushiroda, G. Varner, K. Varvell, Y. S. Velikzhanin, C. C. Wang, M. Z. Wang, M. Watanabe, Y. Watanabe, H. Yamamoto, Y. Yamashita, T. Ziegler

Research output: Contribution to journalArticlepeer-review

Abstract

In order to extend the physics reach of the present B factories, a letter of intent for a Super B factory, with a luminosity of 4 × 1035 cm- 2 s- 1, was submitted in 2004. The paper summarizes recent progress in the design and technological solutions for the silicon vertex detector to be operated at the expected high data rate and background condition of a Super B factory.

Original languageEnglish (US)
Pages (from-to)321-324
Number of pages4
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume572
Issue number1 SPEC. ISS.
DOIs
StatePublished - Mar 1 2007

All Science Journal Classification (ASJC) codes

  • Nuclear and High Energy Physics
  • Instrumentation

Keywords

  • B factory
  • Silicon strip detector
  • Striplet configuration

Fingerprint

Dive into the research topics of 'Silicon vertex detector for the KEK Super B factory'. Together they form a unique fingerprint.

Cite this