Abstract
The structure of silica formed in the cell walls after infiltration of tetraethoxysilane (TEOS) was analyzed by electron microscopy. First, partially hydrolyzed TEOS in ethanol was infiltrated into rehydrated kiln-dried lumber samples of hemlock and pine. Samples were impregnated, cured and then heat treated. Electron microscopy studies were carried out on a Philips CM-20 TEM on microtomed specimens.
| Original language | English (US) |
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| Title of host publication | Proceedings - Annual Meeting, Microscopy Society of America |
| Editors | G.W. Bailey, A.J. Garratt-Reed |
| Pages | 428-429 |
| Number of pages | 2 |
| State | Published - Dec 1 1994 |
| Event | Proceedings of the 52nd Annual Meeting of the Microscopy Society of America - New Orleans, LA, USA Duration: Jul 31 1994 → Aug 5 1994 |
Other
| Other | Proceedings of the 52nd Annual Meeting of the Microscopy Society of America |
|---|---|
| City | New Orleans, LA, USA |
| Period | 7/31/94 → 8/5/94 |
All Science Journal Classification (ASJC) codes
- General Engineering