Selective control of edge-channel trajectories by scanning gate microscopy

N. Paradiso; S. Heun; S. Roddaro; L. N. Pfeiffer; K. W. West; L. Sorba; G. Biasiol; F. Beltram

doi:10.1016/j.physe.2009.11.146

Selective control of edge-channel trajectories by scanning gate microscopy

N. Paradiso, S. Heun, S. Roddaro, L. N. Pfeiffer, K. W. West, L. Sorba, G. Biasiol, F. Beltram

Research output: Contribution to journal › Article › peer-review

28 Scopus citations

Abstract

Electronic Mach-Zehnder interferometers in the quantum Hall (QH) regime are currently discussed for the realization of quantum information schemes. A recently proposed device architecture employs interference between two co-propagating edge channels. Here we demonstrate the precise control of individual edge-channel trajectories in quantum point contact devices in the QH regime. The biased tip of an atomic force microscope is used as a moveable local gate to pilot individual edge channels. Our results are discussed in light of the implementation of multi-edge interferometers.

Original language	English (US)
Pages (from-to)	1038-1041
Number of pages	4
Journal	Physica E: Low-Dimensional Systems and Nanostructures
Volume	42
Issue number	4
DOIs	https://doi.org/10.1016/j.physe.2009.11.146
State	Published - Feb 2010
Externally published	Yes

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Condensed Matter Physics

Keywords

Edge channels
Quantum Hall effect
Quantum point contact
Scanning gate microscopy

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10.1016/j.physe.2009.11.146

Cite this

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title = "Selective control of edge-channel trajectories by scanning gate microscopy",

abstract = "Electronic Mach-Zehnder interferometers in the quantum Hall (QH) regime are currently discussed for the realization of quantum information schemes. A recently proposed device architecture employs interference between two co-propagating edge channels. Here we demonstrate the precise control of individual edge-channel trajectories in quantum point contact devices in the QH regime. The biased tip of an atomic force microscope is used as a moveable local gate to pilot individual edge channels. Our results are discussed in light of the implementation of multi-edge interferometers.",

keywords = "Edge channels, Quantum Hall effect, Quantum point contact, Scanning gate microscopy",

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AU - Paradiso, N.

AU - Heun, S.

AU - Roddaro, S.

AU - Pfeiffer, L. N.

AU - West, K. W.

AU - Sorba, L.

AU - Biasiol, G.

AU - Beltram, F.

PY - 2010/2

Y1 - 2010/2

N2 - Electronic Mach-Zehnder interferometers in the quantum Hall (QH) regime are currently discussed for the realization of quantum information schemes. A recently proposed device architecture employs interference between two co-propagating edge channels. Here we demonstrate the precise control of individual edge-channel trajectories in quantum point contact devices in the QH regime. The biased tip of an atomic force microscope is used as a moveable local gate to pilot individual edge channels. Our results are discussed in light of the implementation of multi-edge interferometers.

AB - Electronic Mach-Zehnder interferometers in the quantum Hall (QH) regime are currently discussed for the realization of quantum information schemes. A recently proposed device architecture employs interference between two co-propagating edge channels. Here we demonstrate the precise control of individual edge-channel trajectories in quantum point contact devices in the QH regime. The biased tip of an atomic force microscope is used as a moveable local gate to pilot individual edge channels. Our results are discussed in light of the implementation of multi-edge interferometers.

KW - Edge channels

KW - Quantum Hall effect

KW - Quantum point contact

KW - Scanning gate microscopy

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JO - Physica E: Low-Dimensional Systems and Nanostructures

JF - Physica E: Low-Dimensional Systems and Nanostructures

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ER -

Selective control of edge-channel trajectories by scanning gate microscopy

Abstract

All Science Journal Classification (ASJC) codes

Keywords

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