Scanning single-electron transistor microscopy: Imaging individual charges

M. J. Yoo, T. A. Fulton, H. F. Hess, R. L. Willett, L. N. Dunkleberger, R. J. Chichester, L. N. Pfeiffer, K. W. West

Research output: Contribution to journal › Article › peer-review

247 Scopus citations

Fingerprint

Dive into the research topics of 'Scanning single-electron transistor microscopy: Imaging individual charges'. Together they form a unique fingerprint.

Engineering

Earth and Planetary Sciences

Physics

Material Science

Keyphrases