Abstract
We present a sapphire (Al2 O3) analyzer for high-resolution X-ray spectroscopy with 31-meV energy resolution. The analyzer is designed for resonant inelastic X-ray scattering (RIXS) measurements at the CuKα absorption edge near 8990 eV. The performance of the analyzer is demonstrated by measuring phonon excitations in beryllium because of its known dynamical structure and high counting rates.
Original language | English (US) |
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Pages (from-to) | 149-151 |
Number of pages | 3 |
Journal | Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment |
Volume | 582 |
Issue number | 1 |
DOIs | |
State | Published - Nov 11 2007 |
All Science Journal Classification (ASJC) codes
- Nuclear and High Energy Physics
- Instrumentation
Keywords
- Resonant inelastic X-ray scattering
- Sapphire
- Synchrotron instrumentation
- X-ray spectrometer