Sapphire analyzers for high-resolution X-ray spectroscopy

Hasan Yavaş, E. Ercan Alp, Harald Sinn, Ahmet Alatas, Ayman H. Said, Yuri Shvyd'ko, Thomas Toellner, Ruben Khachatryan, Simon J.L. Billinge, M. Zahid Hasan, Wolfgang Sturhahn

Research output: Contribution to journalArticle

16 Scopus citations

Abstract

We present a sapphire (Al2 O3) analyzer for high-resolution X-ray spectroscopy with 31-meV energy resolution. The analyzer is designed for resonant inelastic X-ray scattering (RIXS) measurements at the CuKα absorption edge near 8990 eV. The performance of the analyzer is demonstrated by measuring phonon excitations in beryllium because of its known dynamical structure and high counting rates.

Original languageEnglish (US)
Pages (from-to)149-151
Number of pages3
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume582
Issue number1
DOIs
StatePublished - Nov 11 2007

All Science Journal Classification (ASJC) codes

  • Nuclear and High Energy Physics
  • Instrumentation

Keywords

  • Resonant inelastic X-ray scattering
  • Sapphire
  • Synchrotron instrumentation
  • X-ray spectrometer

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    Yavaş, H., Ercan Alp, E., Sinn, H., Alatas, A., Said, A. H., Shvyd'ko, Y., Toellner, T., Khachatryan, R., Billinge, S. J. L., Zahid Hasan, M., & Sturhahn, W. (2007). Sapphire analyzers for high-resolution X-ray spectroscopy. Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 582(1), 149-151. https://doi.org/10.1016/j.nima.2007.08.095