Sample length and frequency dependence of the voltage-oscillation amplitude in NbSe3

T. W. Jing; N. P. Ong

doi:10.1103/PhysRevB.33.5841

Sample length and frequency dependence of the voltage-oscillation amplitude in NbSe3

T. W. Jing
, N. P. Ong

Research output: Contribution to journal › Article › peer-review

12 Scopus citations

Abstract

Measurements of the amplitude vac of the voltage oscillations (narrow-band noise) in NbSe3 as a function of sample length L (300 1/4m to 5 mm) and frequency (50 kHz to 10 MHz) show that vac varies as 1-exp(-L/3/4), where 3/4 is approximately 200 1/4m. For L exceeding 0.9 mm vac is practically L independent. Our data are consistent with the phase-slip model for the voltage oscillations.

Original language	English (US)
Pages (from-to)	5841-5843
Number of pages	3
Journal	Physical Review B
Volume	33
Issue number	8
DOIs	https://doi.org/10.1103/PhysRevB.33.5841
State	Published - 1986

All Science Journal Classification (ASJC) codes

Condensed Matter Physics

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10.1103/PhysRevB.33.5841

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title = "Sample length and frequency dependence of the voltage-oscillation amplitude in NbSe3",

abstract = "Measurements of the amplitude vac of the voltage oscillations (narrow-band noise) in NbSe3 as a function of sample length L (300 1/4m to 5 mm) and frequency (50 kHz to 10 MHz) show that vac varies as 1-exp(-L/3/4), where 3/4 is approximately 200 1/4m. For L exceeding 0.9 mm vac is practically L independent. Our data are consistent with the phase-slip model for the voltage oscillations.",

author = "Jing, \{T. W.\} and Ong, \{N. P.\}",

year = "1986",

doi = "10.1103/PhysRevB.33.5841",

language = "English (US)",

volume = "33",

pages = "5841--5843",

journal = "Physical Review B",

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T1 - Sample length and frequency dependence of the voltage-oscillation amplitude in NbSe3

AU - Jing, T. W.

AU - Ong, N. P.

PY - 1986

Y1 - 1986

N2 - Measurements of the amplitude vac of the voltage oscillations (narrow-band noise) in NbSe3 as a function of sample length L (300 1/4m to 5 mm) and frequency (50 kHz to 10 MHz) show that vac varies as 1-exp(-L/3/4), where 3/4 is approximately 200 1/4m. For L exceeding 0.9 mm vac is practically L independent. Our data are consistent with the phase-slip model for the voltage oscillations.

AB - Measurements of the amplitude vac of the voltage oscillations (narrow-band noise) in NbSe3 as a function of sample length L (300 1/4m to 5 mm) and frequency (50 kHz to 10 MHz) show that vac varies as 1-exp(-L/3/4), where 3/4 is approximately 200 1/4m. For L exceeding 0.9 mm vac is practically L independent. Our data are consistent with the phase-slip model for the voltage oscillations.

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U2 - 10.1103/PhysRevB.33.5841

DO - 10.1103/PhysRevB.33.5841

M3 - Article

AN - SCOPUS:35949022683

SN - 0163-1829

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SP - 5841

EP - 5843

JO - Physical Review B

JF - Physical Review B

IS - 8

ER -

Sample length and frequency dependence of the voltage-oscillation amplitude in NbSe3

Abstract

All Science Journal Classification (ASJC) codes

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