Sample length and frequency dependence of the voltage-oscillation amplitude in NbSe3

T. W. Jing, Nai Phuan Ong

Research output: Contribution to journalArticle

12 Scopus citations

Abstract

Measurements of the amplitude vac of the voltage oscillations (narrow-band noise) in NbSe3 as a function of sample length L (300 1/4m to 5 mm) and frequency (50 kHz to 10 MHz) show that vac varies as 1-exp(-L/3/4), where 3/4 is approximately 200 1/4m. For L exceeding 0.9 mm vac is practically L independent. Our data are consistent with the phase-slip model for the voltage oscillations.

Original languageEnglish (US)
Pages (from-to)5841-5843
Number of pages3
JournalPhysical Review B
Volume33
Issue number8
DOIs
StatePublished - Jan 1 1986

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics

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